Structural and frictional properties of graphene films on SiC(0001) studied by atomic force microscopy

被引：141

作者：

Filleter, T. ^{[1
]}

Bennewitz, R. ^{[1
,2
]}

机构：

[1] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

[2] Leibniz Inst New Mat, D-66123 Saarbrucken, Germany

来源：

PHYSICAL REVIEW B | 2010年 / 81卷 / 15期

基金：

加拿大自然科学与工程研究理事会;

关键词：

GRAPHITE;

D O I：

10.1103/PhysRevB.81.155412

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structural and frictional properties of single-layer and bilayer graphene films on a SiC(0001) substrate are studied by means of atomic force microscopy with atomic resolution. Friction on single-layer graphene is found to be a factor of two larger than on bilayer films for a variety of experimental situations. The friction contrast is found not to originate in differences in structural properties, in lateral contact stiffness, or in contact potential. The transition from atomic stick-slip friction to a regime of ultralow friction is found to occur at normal loads of 40 nN when the tip-sample interaction potential approaches 0.1-0.2 eV.

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