Design of a Threshold Voltage Insensitive 3T1C Pixel Circuit Using a-IGZO TFT for AMOLED Displays

被引:0
作者
Singh, Aryamick [1 ]
Kandpal, Kavindra [2 ]
机构
[1] Birla Inst Technol & Sci Pilani, Dept Elect & Elect, Pilani Campus, Pilani, Rajasthan, India
[2] Indian Inst Informat Technol Allahabad, Dept Elect & Commun Engn, Prayagraj, India
来源
2020 24TH INTERNATIONAL SYMPOSIUM ON VLSI DESIGN AND TEST (VDAT) | 2020年
关键词
AMOLED; Pixel Circuit; V-TH compensating; amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs); THIN-FILM TRANSISTORS; STABILITY;
D O I
10.1109/vdat50263.2020.9190545
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present an innovative 3T1C (3-TFT, 1-Capacitor) pixel architecture for AMOLED displays. The circuit proposed is voltage-programmed and employs amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs). The paper presents detailed and extensive analyses discussing the threshold voltage (V-TH) shift detection and neutralizing ability of the proposed circuit along with a comparison with other recent leading-edge pixel circuits. For a 2.5 mu A current, the error in I-OLED is 0.79%, whereas, for a 1 mu A current, the error is 2.27%. Even for a very small current of 50 nA, the error is limited to only 7.75%.
引用
收藏
页数:5
相关论文
共 12 条
  • [1] [Anonymous], 2018, 2018 25 INT WORKSHOP
  • [2] Threshold Voltage Compensation Error in Voltage Programmed AMOLED Displays
    Bagheri, Mojtaba
    Cheng, Xiang
    Zhang, Junhao
    Lee, Sungsik
    Ashtiani, Shahin
    Nathan, Arokia
    [J]. JOURNAL OF DISPLAY TECHNOLOGY, 2016, 12 (06): : 658 - 664
  • [3] a-InGaZnO thin-film transistors for AMOLEDs: Electrical stability and pixel-circuit simulation
    Chen, Charlene
    Abe, Katsumi
    Kumomi, Hideya
    Kanicki, Jerzy
    [J]. JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2009, 17 (06) : 525 - 534
  • [4] Adaptation of a compact SPICE level 3 model for oxide thin-film transistors
    Kandpal, Kavindra
    Gupta, Navneet
    [J]. JOURNAL OF COMPUTATIONAL ELECTRONICS, 2019, 18 (03) : 1037 - 1044
  • [5] Perspective of zinc oxide based thin film transistors: a comprehensive review
    Kandpal, Kavindra
    Gupta, Navneet
    [J]. MICROELECTRONICS INTERNATIONAL, 2018, 35 (01) : 52 - 63
  • [6] Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
    Lee, Jeong-Min
    Cho, In-Tak
    Lee, Jong-Ho
    Kwon, Hyuck-In
    [J]. APPLIED PHYSICS LETTERS, 2008, 93 (09)
  • [7] STABILITY OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS
    POWELL, MJ
    NICHOLLS, DH
    [J]. IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1983, 130 (01): : 2 - 4
  • [8] Growth of IGZO Thin Films and Fabrication of Transparent Thin Film Transistor by RF Magnetron Sputtering
    Sanal, K. C.
    Majeesh, M.
    Jayaraj, M. K.
    [J]. NANOSTRUCTURED THIN FILMS VI, 2013, 8818
  • [9] Design of a voltage-programmedVTHcompensating pixel circuit for AMOLED displays using diode-connected a-IGZO TFT
    Singh, Aryamick
    Goswami, Manish
    Kandpal, Kavindra
    [J]. IET CIRCUITS DEVICES & SYSTEMS, 2020, 14 (06) : 876 - 880
  • [10] Design of threshold voltage insensitive pixel driver circuitry using a-IGZO TFT for AMOLED displays
    Sodhani, Aditya
    Kandpal, Kavindra
    [J]. MICROELECTRONICS JOURNAL, 2020, 101