Microscopic texture characterisation in piezoceramics

被引:9
作者
Deluca, Marco [1 ,2 ]
机构
[1] Mat Ctr Leoben Forsch GmbH, A-8700 Leoben, Austria
[2] Inst Struktur & Funkt Keram, A-8700 Leoben, Austria
基金
奥地利科学基金会;
关键词
Ferroelectric domains; Texture; Piezoelectricity; X-ray diffraction; Neutron diffraction; Electron diffraction; Raman spectroscopy; LEAD-ZIRCONATE-TITANATE; TEMPLATED GRAIN-GROWTH; MEASURING FRACTURE-TOUGHNESS; X-RAY-DIFFRACTION; CRYSTALLOGRAPHIC ORIENTATIONS; RAMAN-SPECTROSCOPY; NEUTRON-DIFFRACTION; VICKERS INDENTATION; MORPHOTROPIC PZT; DIAMOND FILM;
D O I
10.1080/17436753.2015.1131916
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In polycrystalline piezoelectric ceramics, ferroelectric domain texture is the most important parameter influencing the attainable electromechanical performance. High piezoelectric properties are obtained when the maximum poling of the material is achieved. This condition can be favoured by modifying material composition, poling routes or by proper grain texturing. Hence, it is necessary to characterise domain texture, in order to develop piezoceramics with improved performance. In this review, an outline of the methods for ferroelectric domain texture determination will be given, with focus on microscopic techniques. The advantages and complementarity of methods like X-ray and neutron diffraction, electron diffraction, and Raman spectroscopy will be highlighted.
引用
收藏
页码:112 / 122
页数:11
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