Thermal Modeling of 3-D Stacked DRAM Over SiGe HBT BiCMOS CPU

被引:0
作者
Clarke, Ryan [1 ]
Jacob, Philip [2 ]
Erdogan, Okan [3 ]
Belemijian, Paul [4 ]
Raman, Srikumar [1 ]
Leroy, Mitchell R. [1 ]
Neogi, Tuhin Guha [5 ]
Kraft, Russell P. [1 ]
Borca-Tasciuc, Diana-Andra [6 ]
McDonald, John F. [1 ]
机构
[1] Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[3] Istanbul Tech Univ, Natl High Performance Ctr Turkey, TR-34469 Istanbul, Turkey
[4] Naval Res Lab, Baltimore, MD 21227 USA
[5] GlobalFoundries, Malta, NY 12020 USA
[6] Rensselaer Polytech Inst, Dept Mech Aerosp & Nucl Engn, Troy, NY 12180 USA
来源
IEEE ACCESS | 2015年 / 3卷
基金
美国国家科学基金会;
关键词
Microprocessors; memory; simulation; modeling; Moore's law; 3D IC; thermal management; thermal analysis; DIAMOND; CONDUCTIVITY;
D O I
10.1109/ACCESS.2015.2396474
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
We have previously evaluated the feasibility of a serial code accelerator core with 3-D DRAM stacked on the core operating at high frequencies. While operating at such high frequencies (> 24 GHz), there are concerns with removing heat from the 3-D stack. We propose the use of thin diamond sheets, which have high thermal conductivity, as a heat spreader by bonding it close to the processor core substrate and memory stacks. We show, through thermal modeling using COMSOL finite-element analysis tools, the feasibility of diamond as an effective heat spreader in a processor-memory 3-D stack.
引用
收藏
页码:43 / 54
页数:12
相关论文
共 36 条
  • [1] Alioto M., 2005, MODEL DESIGN BIPOLAR
  • [2] Amdahl G.M, 1967, AFIPS67 SPRING P AFI, P483, DOI DOI 10.1145/1465482.1465560
  • [3] [Anonymous], 2004, MOBILITY HALL EFFECT, V520
  • [4] [Anonymous], 2010, SP3 ADV DIAMOND PROD
  • [5] [Anonymous], 2010, COMSOL Multiphysics Reference Manual
  • [6] THERMAL-DIFFUSIVITY OF ISOTOPICALLY ENRICHED C-12 DIAMOND
    ANTHONY, TR
    BANHOLZER, WF
    FLEISCHER, JF
    WEI, LH
    KUO, PK
    THOMAS, RL
    PRYOR, RW
    [J]. PHYSICAL REVIEW B, 1990, 42 (02): : 1104 - 1111
  • [7] SiGe HBT microprocessor core test vehicle
    Belemjian, PM
    Erdogan, O
    Kraft, RP
    McDonald, JF
    [J]. PROCEEDINGS OF THE IEEE, 2005, 93 (09) : 1669 - 1678
  • [8] Interlayer cooling potential in vertically integrated packages
    Brunschwiler, T.
    Michel, B.
    Rothuizen, H.
    Kloter, U.
    Wunderle, B.
    Oppermann, H.
    Reichl, H.
    [J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2009, 15 (01): : 57 - 74
  • [9] Brunschwiler T., 2009, Proc. 3DIC 2009, P1
  • [10] A wafer-scale 3-D circuit integration technology
    Burns, James A.
    Aull, Brian F.
    Chen, Chenson K.
    Chen, Chang-Lee
    Keast, Craig L.
    Knecht, Jeffrey M.
    Suntharalingam, Vyshnavi
    Warner, Keith
    Wyatt, Peter W.
    Yost, Donna-Ruth W.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (10) : 2507 - 2516