A fabrication process with high thermal isolation and vacuum sealed lead transfer for gas reactors and sampling microsystems

被引:0
|
作者
McNamara, S [1 ]
Gianchandani, YB [1 ]
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a six-mask fabrication process for vacuum-scaled microsystems including pressure and flow sensors, reaction chambers and reservoirs, and channels ranging from 100 nm to 10 mum in hydraulic diameter. All structures are countersunk into a glass substrate, resulting in a planar upper surface that eliminates stress concentrations and also facilitates further lithographic processing. The material choices and structural arrangements are designed to provide high thermal isolation (similar to2x10(5) K/W). Lead transfer between the three available levels of interconnect are accomplished with minimal parasitic capacitance (<1 fF), and low resistance (similar to1 Omega). A variety of test structures have been successfully fabricated.
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页码:646 / 649
页数:4
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