Two alternatives to the Shewhart (X)over-bar control chart

被引:112
作者
Klein, M [1 ]
机构
[1] Columbia Univ, Dept Ind Engn & Operat Res, New York, NY 10027 USA
关键词
average run length; control charts; runs test;
D O I
10.1080/00224065.2000.11980028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Average run length (ARL) values are calculated for two (X) over bar control chart schemes and compared with those of a standard Shewhart chart. Both control charts are based on runs rules and are easily implemented. An out-of-control condition for one of the charts is a run of two of two successive points beyond a special control limit. The other chart uses a run of two of three successive points beyond a different control limit. Both schemes are shown to have better, that is, lower, ARL values than the standard Shewhart chart for process average shifts as large as 2.6 standard deviations from the mean.
引用
收藏
页码:427 / 431
页数:5
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