Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry

被引:43
|
作者
Lee, Ju-Yi
Shih, Hsueh-Ching
Hong, Cyun-Tai
Chou, Teng Ko
机构
[1] Natl Ctr Univ, Inst Optomech Engn, Chungli 320, Taiwan
[2] Natl Ctr Univ, Dept Mech Engn, Chungli 320, Taiwan
[3] Ind Technol Res Inst, Ctr Measurement Standards, Hsinchu 300, Taiwan
关键词
phase quadrature interferometry; surface plasmon resonance; refractive index;
D O I
10.1016/j.optcom.2007.04.021
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The phase difference change between the s and p polarization lights in surface plasmon resonance sensing systems is strongly influenced by the refractive index of the test sample. In this paper, the phase difference change, measured by common-path phase quadrature interferometry, can be used to estimate the refractive index change. In the experimental results we obtain a phase stability of 0.07 degrees, and a resolving power for the refractive index of 6 x 10(-6) RIU. This method has the advantages of a simple optical setup, being easier to operate in real time, and low cost. In addition, due to the common-path arrangement, our method can also eliminate the surrounding noise. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:283 / 287
页数:5
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