Practical technique for measurement of second-order nonlinearity in poled glass

被引：14

作者：

Corbari, C ^{[1
]}

Deparis, O ^{[1
]}

Klappauf, BG ^{[1
]}

Kazansky, PG ^{[1
]}

机构：

[1] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England

来源：

ELECTRONICS LETTERS | 2003年 / 39卷 / 02期

关键词：

D O I：

10.1049/el:20030137

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1 mum resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.

引用

页码：197 / 198

页数：2

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