Crystallization kinetic and dielectric properties of CaO-MgO-Al2O3-SiO2 glass/Al2O3 composites

被引：0

作者：

Gong, Weiping ^{[1
]}

Luo, Zhihong ^{[1
]}

Liu, Yanzhi ^{[2
]}

机构：

[1] Huizhou Univ, Guangdong Prov Key Lab Elect Funct Mat & Devices, Yanda Rd 46, Huizhou 516001, Guangdong, Peoples R China

[2] Clarkson Univ, Dept Chem & Biomol Engn, Potsdam, NY 13699 USA

来源：

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH | 2022年 / 113卷 / 05期

关键词：

CaO-MgO-Al2O3-SiO2; glass; Al2O3; composites; Crystallization kinetic; Dielectric property; Differential scanning calorimetry; GLASS-CERAMICS; MICROSTRUCTURE; DENSIFICATION; MECHANISM; BEHAVIOR; ALUMINA;

D O I：

10.1515/ijmr-2021-8453

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

The sintering behavior and the dielectric properties of CaO-MgO-Al2O3-SiO2 (CMAS) glass and CMAS glass/Al2O3 ceramic composites were studied by the combination of differential scanning calorimetry, X-ray diffraction and scanning electron microscopy as well as dielectric properties measurement. The results demonstrate that the CMAS glass with composition 25CaO-15MgO-12Al(2)O(3)-48SiO(2) (wt.%) can significantly improve the sintering performance of Al2O3 ceramics, and does not lead to an obvious decrease in the dielectric properties. Low dielectric constant and low dielectric loss were obtained when sintering the CMAS/Al2O3 composites at 1273 K, which demonstrate that it satisfies the requirement of the integrated circuit substrate materials when working at high frequency.

引用

页码：520 / 528

页数：9

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