Effect of annealing on the structure of Bi2Te3-Bi2Se3 films

被引：7

作者：

Abdullayev, N. M. ^{[1
]}

Mekhtiyeva, S. I. ^{[1
]}

Memmedov, N. R. ^{[1
]}

Ramazanov, M. A. ^{[1
]}

Kerimova, A. M. ^{[1
]}

机构：

[1] Natl Acad Sci Azerbaijan, Inst Phys, AZ-1143 Baku, Azerbaijan

来源：

SEMICONDUCTORS | 2010年 / 44卷 / 06期

关键词：

Atomic Force Microscopy Image; Polycrystalline Film; High Substrate Temperature; Bismuth Film; Crystallization Dynamic;

D O I：

10.1134/S1063782610060230

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The crystallization dynamics of Bi2Te3-Bi2Se3 polycrystalline films annealed at 200-230A degrees C has been investigated. The formation of ordered blocks 70-150 nm in size, depending on the annealing time and temperature, is observed.

引用

页码：824 / 827

页数：4

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