A One-Shot Digital Correlated Double Sampling with a Differential Difference Amplifier for a High Speed CMOS Image Sensor

被引：0

作者：

Son, Suho ^{[1
]}

Jeon, Shiwon ^{[1
]}

Namgung, Seol ^{[1
]}

Yoo, Jieun ^{[1
]}

Song, Minkyu ^{[1
]}

机构：

[1] Dongguk Univ, Dept Semicond Sci, 3-26 Phil Dong, Seoul 100715, South Korea

来源：

2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2015年

关键词：

one-shot digital correlated double sampling; fixed pattern noise; differential difference amplifier; CMOS Image Sensor;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In order to raise the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, a fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a one-shot digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 mu m CIS technology and it has the VGA resolution of 640x480. The measured conversion time is 16 mu s, and a high frame rate of 131fps is achieved at the VGA resolution.

引用

页码：1054 / 1057

页数：4

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