Fluorine depth profiling by high-resolution 1D magnetic resonance imaging

被引：12
作者：
Diki, T.
Erich, S. J. F.
Ming, W.
Huinink, H. P.
Thune, P. C.
van Benthem, R. A. T. M.
de With, G.
机构：
[1] Eindhoven Univ Technol, Lab Mat & Interface Chem, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[3] Eindhoven Univ Technol, Schuit Inst Catalysis, NL-5600 MB Eindhoven, Netherlands
[4] Dutch Polymer Inst, NL-5600 AX Eindhoven, Netherlands
来源：
POLYMER | 2007年 / 48卷 / 14期
关键词：
magnetic resonance imaging; fluorine depth profiling; X-ray photoelectron spectroscopy;
D O I：
10.1016/j.polymer.2007.05.017
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
High-resolution magnetic resonance imaging (MRI) has been used, for the first time, to measure fluorine concentration profiles with a high spatial resolution (5 mu m) along the full film depth of fluorinated polyurethane films. The MRI fluorine profiles were consistent with the results obtained by X-ray photoelectron spectrosccpy (XPS) in combination with microtoming. MRI is a nondestructive and potentially quantitative technique for probing the spatial distribution of small quantities of fluorine in coatings and multi-layered systems. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码：4063 / 4067
页数：5
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