Fluorine depth profiling by high-resolution 1D magnetic resonance imaging

被引：12
|
作者：
Diki, T.
Erich, S. J. F.
Ming, W.
Huinink, H. P.
Thune, P. C.
van Benthem, R. A. T. M.
de With, G.
机构：
[1] Eindhoven Univ Technol, Lab Mat & Interface Chem, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[3] Eindhoven Univ Technol, Schuit Inst Catalysis, NL-5600 MB Eindhoven, Netherlands
[4] Dutch Polymer Inst, NL-5600 AX Eindhoven, Netherlands
来源：
POLYMER | 2007年 / 48卷 / 14期
关键词：
magnetic resonance imaging; fluorine depth profiling; X-ray photoelectron spectroscopy;
D O I：
10.1016/j.polymer.2007.05.017
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
High-resolution magnetic resonance imaging (MRI) has been used, for the first time, to measure fluorine concentration profiles with a high spatial resolution (5 mu m) along the full film depth of fluorinated polyurethane films. The MRI fluorine profiles were consistent with the results obtained by X-ray photoelectron spectrosccpy (XPS) in combination with microtoming. MRI is a nondestructive and potentially quantitative technique for probing the spatial distribution of small quantities of fluorine in coatings and multi-layered systems. (c) 2007 Elsevier Ltd. All rights reserved.
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页码：4063 / 4067
页数：5
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