Ti K-edge XANES and Pb LIII-edge EXAFS studies of PbZr0.40Ti0.60O3 ferroelectric material

被引:37
作者
Mesquita, Alexandre [1 ]
Michalowicz, Alain
Mastelaro, Valmor Roberto [1 ]
机构
[1] Univ Sao Paulo, Inst Fis Sao Carlos, Sao Carlos, SP, Brazil
来源
14TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS14), PROCEEDINGS | 2009年 / 190卷
关键词
LEAD;
D O I
10.1088/1742-6596/190/1/012081
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The structure of PbZr0.40Ti0.60O3 crystalline ferroelectric material was studied by powder X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) at Ti K-edge and Extended X-ray Absorption Fine Structure (EXAFS) at Pb L-III-edge. The XRD Rietveld refinement shows a tetragonal crystal structure. The resulting crystal model was used to calculate both theoretical XAFS spectra. The mismatch beween experimental and calculated XAFS spectra is interpreted as a consequence of the random distribution of Ti and Zr. The resulting disorder effect is averaged in the long-range structure probed by XRD whereas the XAFS techniques probe the local order of each site.
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页数:4
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