Manipulation and conductivity measurements of gold nanowires

被引:44
作者
Wilms, M [1 ]
Conrad, J [1 ]
Vasilev, K [1 ]
Kreiter, M [1 ]
Wegner, G [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
关键词
gold nanowire; nanomanipulation; scanning electron microscopy; electrical conductivity; electromigration;
D O I
10.1016/j.apsusc.2004.05.251
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A low drift nanomanipulation device operating in a scanning electron microscope was constructed. The device allowed to manipulate and to characterize the electrical properties of flexible and highly conductive gold nanowires with diameters down to 15 nm. Individual nanowires could be electrically contacted either to substrate electrodes or to movable tip electrodes of the nanomanipulation device. Measuring the total resistance of a single nanowire at different lengths gave the intrinsic conductivity (sigma approximate to 2.6 x 10(7) S/m) close to that of the bulk material (sigma = 4.3 x 10(7) S/m). At high current densities the phenomenon of electromigration could be observed. The problem of spontaneous deposition of insulating layers on the gold objects from contaminations in the SEM chamber is addressed. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:490 / 494
页数:5
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