Investigation of silica nanoparticles by Auger electron spectroscopy (AES)

被引：15

作者：

Rades, S. ^{[1
]}

Wirth, T. ^{[1
]}

Unger, W. ^{[1
]}

机构：

[1] Fed Inst Mat Res & Testing, Div Surface Anal & Interfacial Chem 6 8, D-12205 Berlin, Germany

来源：

SURFACE AND INTERFACE ANALYSIS | 2014年 / 46卷 / 10-11期

关键词：

nanoparticles; Auger electron spectroscopy; surface analysis;

D O I：

10.1002/sia.5378

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

High-priority industrial nanomaterials like SiO2, TiO2, and Ag are being characterized on a systematic basis within the framework of the EU FP7 research project NanoValid. Silica nanoparticles from an industrial source have been analyzed by Auger electron spectroscopy. Point, line, and map spectra were collected. Material specific and methodological aspects causing the special course of Auger line scan signals will be discussed. Copyright (C) 2014 John Wiley & Sons, Ltd.

引用

页码：952 / 956

页数：5

共 5 条

[1]

Baumgartl S., 1996, ENTWICKLUNG VERFAHRE

[2] Submicron particle analysis by the Auger microprobe (FE-SAM) [J].

Ito, H ;

Ito, M ;

Magatani, Y ;

Soeda, F .

APPLIED SURFACE SCIENCE, 1996, 100 :152-155

[3]

Li Y., 2011, M CARLO SIMULATION S

[4]

Narayanan A, 2013, KONA POWDER PART J, P221

[5] Quantitative evaluation of surface damage onSiO2/Si specimen caused by electron beam irradiation [J].

Tanuma, S ;

Kimura, T ;

Nishida, K ;

Hashimoto, S ;

Inoue, M ;

Ogiwara, T ;

Suzuki, M ;

Miura, K .

APPLIED SURFACE SCIENCE, 2005, 241 (1-2) :122-126

← 1 →