An Improved Macro-Model for Simulation of Single Electron Transistor (SET) Using HSPICE

被引:6
作者
Karimian, M. [1 ]
Dousti, M. [1 ]
Pouyan, M. [2 ]
Faez, R. [3 ]
机构
[1] Islamic Azad Univ, Dept Elect Engn, Sci & Res Branch, Tehran, Iran
[2] Shahed Univ, Fac Engn, Tehran, Iran
[3] Sharif Univ Technol, Fac Engn, Tehran, Iran
来源
IEEE TIC-STH 09: 2009 IEEE TORONTO INTERNATIONAL CONFERENCE: SCIENCE AND TECHNOLOGY FOR HUMANITY | 2009年
关键词
Single electron transistor (SET); Macro-model; HSPICE; SIMON; Switched capacitor circuit; Quantizer; COMPACT SIMULATION; DESIGN; MODEL; CIRCUITS; DEVICES;
D O I
10.1109/TIC-STH.2009.5444535
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
To get a more accurate model for simulation of single electron transistors (SETs), we have proposed a new macro-model that includes the ability of electron tunneling time calculation. In our proposed model, we have modified the previous models and applied some basic corrections to their formulas. In addition, we have added a switched capacitor circuit, as a quantizer, to calculate the electron tunneling time. We used HSPICE for high-speed simulation and observed that the simulation results obtained from our model matched more closely with that of SIMON 2.0. We also could evaluate the time of electron tunneling through the barrier by using the quantizer. Clearly, our macro-model gives more accurate results than of the other models when compare with SIMON 2.0, and can be used for calculating the delay time of complicated circuits.
引用
收藏
页码:1000 / 1004
页数:5
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