Near-field study of light scattering at rough interfaces of a-Si:H/μc-Si:H tandem solar cells

被引：20
|
作者：
Bittkau, K. [1 ]
Beckers, T. [1 ]
机构：
[1] Forschungszentrum Julich GmbH, Inst Energieforsch 5, D-52425 Julich, Germany
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2010年 / 207卷 / 03期
关键词：
SILICON; GRATINGS;
D O I：
10.1002/pssa.200982671
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Light scattering at randomly textured interfaces in tandem solar cells consisting of hydrogenated amorphous silicln (a-SiH) and hydrogenated microcrystalline silicon (mu c-Si:H) is studied in the optical near field experimentally by near-field scanning optical microscopy (NSOM) and theoretically by a rigorous solution of Maxwell's equations using a Fourier ansatz. The work concentrates on the influence of evanescent light modes on the absorption in the a-Si:H top cell. It is found that the improvement of solar cell efficiency due to the surface texturing is borne by evanescent light modes. For both, the theoretical and the experimentla study techniques are developed to extract the evanescent part of the light from the obtained data. From the theoretical results the principal mechanism of light scattering in the optical near field regime is studied and in particular, light which is strapped in the a-Si:H top cell by total internal reflection is visualized. From the experiemntal results, a map of the local light trapping efficiency is generated and the correlation to morphological properties is studied. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：661 / 666
页数：6
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