共 14 条
[2]
Brilliance scaling of discharge sources for extreme-ultraviolet and soft x-ray radiation for metrology applications
[J].
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS,
2012, 11 (02)
[7]
Multilayers for next generation EUVL at 6.Xnm
[J].
EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE II,
2011, 8076
[9]
Characterization and optimization of the laser-produced plasma EUV source at 13.5 nm based on a double-stream Xe/He gas puff target
[J].
APPLIED PHYSICS B-LASERS AND OPTICS,
2010, 101 (04)
:773-789
[10]
Tao W, 2013, PLASMA SCI TECHNOL, V15, P435