共 50 条
- [1] Finite Element Analysis of Thermal Stress in Through-Silicon Via Structure 2012 7TH INTERNATIONAL CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING (ICECE), 2012,
- [2] Finite element analysis of electromigration induced stress in through-silicon-via Su, Fei, 1600, Beijing University of Aeronautics and Astronautics (BUAA) (40):
- [7] Theoretical study of the diffusion of lithium in crystalline and amorphous silicon JETP Letters, 2012, 95 : 143 - 147
- [8] Diffusion of Lithium in Bulk Amorphous Silicon: A Theoretical Study JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (42): : 22212 - 22216
- [9] A Study on Performance Enhancement of Electromagnetic Generator Via Finite Element Analysis 2012 IEEE SYMPOSIUM ON INDUSTRIAL ELECTRONICS AND APPLICATIONS (ISIEA 2012), 2012,