Equivalence of LTSLM and LTSEM analyses:: study of a YBa2Cu3O7 multi-layer device

被引：7
作者：
Dieckmann, N
Friemel, S
Bock, A
Merkt, U
Gerber, R
Huebener, RP
机构：
[1] Univ Hamburg, Inst Angew Phys, D-20355 Hamburg, Germany
[2] Univ Hamburg, Zentrum Mikrostrukturforsch, D-20355 Hamburg, Germany
[3] Univ Tubingen, Inst Phys, Lehrstuhl Expt Phys 2, D-72076 Tubingen, Germany
来源：
PHYSICA C | 1997年 / 292卷 / 1-2期
关键词：
D O I：
10.1016/S0921-4534(97)01649-3
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Low-temperature scanning electron microscopy (LTSEM) and low-temperature scanning laser microscopy (LTSLM) are both methods for analyzing local electrical properties of superconducting devices. With both techniques we have investigated a YBa2Cu3O7, (YBCO) multi-layer device on a SrTiO3, (100) substrate namely a micro-bridge containing a set of crossovers. We find that critical current density and critical temperature of this device are reduced at the edges of the crossovers, Complete equivalence of the results obtained for LTSEM and LTSLM has been found, in particular concerning the spatial distribution, the temperature dependence, and the strength of the signal. (C) 1997 Elsevier Science B.V.
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收藏
页码：133 / 139
页数：7
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