Polarized Raman Spectroscopy and Chemometric Analysis of Micro-crystalline Silicon for Solar Cells

被引：0
|
作者：
Adley, David [1 ]
Perova, Tatiana S. [1 ,2 ]
Monaghan, Eamonn [3 ]
Ellingboe, A. R. [3 ]
机构：
[1] Trinity Coll Dublin, Dept Elect & Elect Engn, Dublin, Ireland
[2] ITMO Univ, St Petersburg, Russia
[3] Dublin City Univ, Sch Phys Sci, Dublin 9, Ireland
来源：
2015 3RD ASIA CONFERENCE ON MECHANICAL AND MATERIALS ENGINEERING (ACMME 2015) | 2015年 / 26卷
关键词：
LARGE-AREA; DEPOSITION; FILMS;
D O I：
10.1051/matecconf/20152601011
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Micro-crystalline silicon (mu c-Si: H) is currently under extensive investigation due to it's applications in solar cells. The crystalline content and structural properties of mu c-Si: H can be determined from several characterisation techniques such as high-resolution transmission electron microscopy (HRTEM), X-Ray diffraction (XRD), spectroscopic ellipsometry (SE) and Raman spectroscopy. In this paper a solution is proposed to reduce the effect of second order phonons on the Raman spectra of mu c-Si: H for evaluation of crystalline volume fraction chi(c).
引用
收藏
页数：4
相关论文
共 50 条
  • [21] Micro-spectroscopy on silicon wafers and solar cells
    Paul Gundel
    Martin C Schubert
    Friedemann D Heinz
    Robert Woehl
    Jan Benick
    Johannes A Giesecke
    Dominik Suwito
    Wilhelm Warta
    Nanoscale Research Letters, 6
  • [22] Micro/Nanotexture Crystalline Silicon Solar Cells for Space Applications
    Kowsari, Mohammad Reza
    Asad, Mohsen
    Ostovari, Abbas
    Mojab, Alireza
    Sheikhi, Mohammad Hossein
    2014 22ND IRANIAN CONFERENCE ON ELECTRICAL ENGINEERING (ICEE), 2014, : 167 - 170
  • [23] Raman Tensor Analysis of Crystalline Lead Titanate by Quantitative Polarized Spectroscopy
    Fujii, Y.
    Noju, M.
    Shimizu, T.
    Taniguchi, H.
    Itoh, M.
    Nishio, I.
    FERROELECTRICS, 2014, 462 (01) : 120 - 125
  • [24] Why does the open-circuit voltage in a micro-crystalline silicon PIN solar cell decrease with increasing crystalline volume fraction?
    Johnson, E. V.
    Nath, M.
    Roca i Cabarrocas, P.
    Abramov, A.
    Chatterjee, P.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (19-25) : 2455 - 2459
  • [25] Hydrogenated Nano-/Micro-Crystalline Silicon Thin-Films for Thermoelectrics
    Acosta, E.
    Wight, N. M.
    Smirnov, V.
    Buckman, J.
    Bennett, N. S.
    JOURNAL OF ELECTRONIC MATERIALS, 2018, 47 (06) : 3077 - 3084
  • [26] Preparation and characterization of micro-crystalline hydrogenated silicon carbide p-layers
    Eser, E
    Hegedus, SS
    Buchanan, WA
    NCPV PHOTOVOLTAICS PROGRAM REVIEW: PROCEEDINGS OF THE 15TH CONFERENCE, 1999, 462 : 254 - 259
  • [27] Hydrogenated Nano-/Micro-Crystalline Silicon Thin-Films for Thermoelectrics
    E. Acosta
    N. M. Wight
    V. Smirnov
    J. Buckman
    N. S. Bennett
    Journal of Electronic Materials, 2018, 47 : 3077 - 3084
  • [28] Contrast enhancement on crystalline silicon in polarized reflection mode tip-enhanced Raman spectroscopy
    Nguyen, Quang
    Ossikovski, Razvigor
    Schreiber, Joachim
    OPTICS COMMUNICATIONS, 2007, 274 (01) : 231 - 235
  • [29] Characterization of Gasoline by Raman Spectroscopy with Chemometric Analysis
    Ardila, Jorge Armando
    Felipe Soares, Frederico Luis
    dos Santos Farias, Marco Antonio
    Carneiro, Renato Lajarim
    ANALYTICAL LETTERS, 2017, 50 (07) : 1126 - 1138
  • [30] Raman spectroscopy of hydrogen molecules in crystalline silicon
    Leitch, AWR
    Alex, V
    Weber, J
    PHYSICAL REVIEW LETTERS, 1998, 81 (02) : 421 - 424
12345