Noise spectroscopy of molecular electronic junctions

被引:10
作者
Kim, Youngsang [1 ,3 ]
Song, Hyunwook [2 ]
机构
[1] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
[2] Kyung Hee Univ, Dept Appl Phys, Yongin 446701, South Korea
[3] Ambrose Way, Sacramento, CA 95831 USA
基金
新加坡国家研究基金会;
关键词
RANDOM TELEGRAPH SIGNALS; SELF-ASSEMBLED MONOLAYERS; LOW-FREQUENCY NOISE; GENERATION-RECOMBINATION NOISE; CHAIN-LENGTH DEPENDENCE; 1/F NOISE; SHOT-NOISE; CHARGE-TRANSPORT; FLICKER NOISE; CONDUCTANCE FLUCTUATIONS;
D O I
10.1063/5.0027602
中图分类号
O59 [应用物理学];
学科分类号
摘要
Over the past few decades, the field of molecular electronics has greatly benefited from advances in the fundamental understanding of charge transport mechanisms. Molecular junctions represent a field whose potential is realized through detailed studies of charge transport on the nanoscale. Applications of molecular junctions, such as molecular logic circuits, rely on precise mechanistic information as investigative techniques are refined. Current advances have originated from improvements in a variety of characterization techniques, with noise spectroscopy contributing to key studies of transport phenomena. Noise spectroscopy has shown to be useful for probing latent electronic characteristics in molecular junctions, giving insight beyond standard methods of charge transport study. This review presents an in-depth background on fundamental concepts in electronic noise spectroscopy, covering topics such as flicker, generation-recombination, random telegraph signal, and shot noises. Recent advances in noise spectroscopy techniques and their applications to the study of molecular junctions are discussed, highlighting the impact of this technique in the improvement of molecular junction stability and reliability, the study of interference in charge transport, and the emergence of vibrational excitation phenomena. This review provides a comprehensive understanding of noise analyses in the field of molecular junctions and gives insight for further advances in molecular and nanoscale electronics.
引用
收藏
页数:17
相关论文
共 192 条
[1]   Flicker Noise as a Probe of Electronic Interaction at Metal-Single Molecule Interfaces [J].
Adak, Olgun ;
Rosenthal, Ethan ;
Meisner, Jeffer ;
Andrade, Erick F. ;
Pasupathy, Abhay N. ;
Nuckolls, Colin ;
Hybertsen, Mark S. ;
Venkataraman, Latha .
NANO LETTERS, 2015, 15 (06) :4143-4149
[2]   Quantum properties of atomic-sized conductors [J].
Agraït, N ;
Yeyati, AL ;
van Ruitenbeek, JM .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 2003, 377 (2-3) :81-279
[3]   The Role of the Oxygen/Water Redox Couple in Suppressing Electron Conduction in Field-Effect Transistors [J].
Aguirre, Carla M. ;
Levesque, Pierre L. ;
Paillet, Matthieu ;
Lapointe, Francois ;
St-Antoine, Benoit C. ;
Desjardins, Patrick ;
Martel, Richard .
ADVANCED MATERIALS, 2009, 21 (30) :3087-+
[4]   Towards molecular electronics with large-area molecular junctions [J].
Akkerman, HB ;
Blom, PWM ;
de Leeuw, DM ;
de Boer, B .
NATURE, 2006, 441 (7089) :69-72
[5]   Characterization of oxide traps in 0.15 μm2 MOSFETs using random telegraph signals [J].
Amarasinghe, NV ;
Çelik-Butler, Z ;
Vasina, P .
MICROELECTRONICS RELIABILITY, 2000, 40 (11) :1875-1881
[6]   Extraction of oxide trap properties using temperature dependence of random telegraph signals in submicron metal-oxide-semiconductor field-effect transistors [J].
Amarasinghe, NV ;
Çelik-Butler, Z ;
Keshavarz, A .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (10) :5526-5532
[7]  
Ambrozy A., 1982, ELECT NOISE
[8]   Random telegraph signal and 1/f noise in forward-biased single-walled carbon nanotube film-silicon Schottky junctions [J].
An, Yanbin ;
Rao, Hemant ;
Bosman, Gijs ;
Ural, Ant .
APPLIED PHYSICS LETTERS, 2012, 100 (21)
[9]   Single-molecule junctions beyond electronic transport [J].
Aradhya, Sriharsha V. ;
Venkataraman, Latha .
NATURE NANOTECHNOLOGY, 2013, 8 (06) :399-410
[10]   Real-Time Detection of Redox Events in Molecular Junctions [J].
Arielly, Rani ;
Vadai, Michal ;
Kardash, Dina ;
Noy, Gilad ;
Selzer, Yoram .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2014, 136 (06) :2674-2680