X-ray phase imaging with single phase grating

被引：49

作者：

Takeda, Yoshihiro

Yashiro, Wataru

Suzuki, Yoshio

Aoki, Sadao

Hattori, Tadashi

Momose, Atsushi

机构：

[1] Univ Tsukuba, Grad Sch Pure & Appl Sci, Tsukuba, Ibaraki 3058573, Japan

[2] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Kashiwa, Chiba 2778561, Japan

[3] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan

[4] Univ Hyogo, Lab Adv Sci & Technol Ind, Kamigori, Hyogo 6781205, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2007年 / 46卷 / 1-3期

关键词：

X-ray imaging; phase measurement; Talbot effect; tomography; X-ray interferometer; PERIODIC OBJECTS; TOMOGRAPHY; IMAGES;

D O I：

10.1143/JJAP.46.L89

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 mu m pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an Xray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 mu m spatial resolution and a 9 mg/cm(3) detection limit of density deviation.

引用

页码：L89 / L91

页数：3

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