X-ray phase imaging with single phase grating

X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 mu m pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an Xray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 mu m spatial resolution and a 9 mg/cm(3) detection limit of density deviation.