X-ray phase imaging with single phase grating

被引：50
作者：
Takeda, Yoshihiro
Yashiro, Wataru
Suzuki, Yoshio
Aoki, Sadao
Hattori, Tadashi
Momose, Atsushi
机构：
[1] Univ Tsukuba, Grad Sch Pure & Appl Sci, Tsukuba, Ibaraki 3058573, Japan
[2] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Kashiwa, Chiba 2778561, Japan
[3] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan
[4] Univ Hyogo, Lab Adv Sci & Technol Ind, Kamigori, Hyogo 6781205, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2007年 / 46卷 / 1-3期
关键词：
X-ray imaging; phase measurement; Talbot effect; tomography; X-ray interferometer; PERIODIC OBJECTS; TOMOGRAPHY; IMAGES;
D O I：
10.1143/JJAP.46.L89
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 mu m pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an Xray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 mu m spatial resolution and a 9 mg/cm(3) detection limit of density deviation.
引用
收藏
页码：L89 / L91
页数：3
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