Refractive Index Measurement by Using an Optoelectronic Oscillator

被引：60

作者：

Nguyen, Lam Duy ^{[1
]}

Nakatani, Keitaro ^{[2
]}

Journet, Bernard ^{[1
]}

机构：

[1] ENS, CNRS, Inst Alembert, SATIE Lab, F-94230 Cachan, France

[2] ENS, PPSM Lab, Inst Alembert, CNRS, F-94230 Cachan, France

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2010年 / 22卷 / 12期

关键词：

Free spectral range (FSR); optoelectronic oscillator (OEO); phase noise; refractive index;

D O I：

10.1109/LPT.2010.2046028

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The purpose of this letter is to present a preliminary experiment, showing that an optoelectronic oscillator can be used for measuring refractive index by detecting the change of the oscillation frequency. The uncertainty of the measurement is of about 10(-2). However, this value can decrease to 10(-3) or less if the mechanic vibrations, the temperature control of liquid, and the long-term stability of the oscillator are improved. Measurements have been performed for acetonitrile, acetone, dioxane, and chloroform at the wavelength of 1535 nm and at 25 degrees C approximately.

引用

页码：857 / 859

页数：3

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