Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry

被引：15
作者：
Ma, Chao [1 ,2 ]
Wang, Hong Guang [1 ,2 ]
Zhao, Peng Jun [1 ,2 ]
Xu, Jin Bao [1 ]
Chang, Ai Min [1 ]
Wang, Lei [1 ]
Bian, Liang [1 ]
机构：
[1] Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
来源：
MATERIALS LETTERS | 2014年 / 136卷
基金：
中国国家自然科学基金; 中国科学院西部之光基金;
关键词：
Thin films; Spectroscopic ellipsometry; Temperature dependence; Mechanism;
D O I：
10.1016/j.matlet.2014.08.025
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The optical properties of spinel Mn1.56Co0.96Ni0.48O4 thin films have been investigated by spectroscopic ellipsometry in the temperature range from 20 to 260 degrees C. By fitting the measured ellipsometric parameter data with a three-layer model by Tauc-Lorentz oscillator dispersion formula, the refractive index and extinction coefficient of the thin films are determined in the spectral range of 280-850 nm. The refractive index decreases in the short-wavelength region but increases in the long-wavelength region with increasing temperature. The extinction coefficient increases with increasing temperature in all visible region. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：225 / 228
页数：4
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