Exploring a homotopy approach for the design of nanometer digital circuits tolerant to process variations

被引:0
作者
Dominguez Rodriguez, Gilberto [1 ]
Luis Garcia-Gervacio, Jose [1 ]
Vazquez Leal, Hector [1 ]
机构
[1] Univ Veracruzana, Xalapa, Veracruz, Mexico
关键词
process variation; homotopy continuation method; Lagrange Multiplier; gate-sizing; optimization algorithm; GATE; ALGORITHM;
D O I
10.1587/elex.15.20180475
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is known that process parameter variation degrades the performance of nanometer integrated circuits. Process variations reduce the maximum clock frequency operation of the chips. Diverse strategies have been proposed in the literature to overcome this issue, especially optimization algorithms (gate-sizing algorithms). However, convergence related problems have limited their use. In this work, a homotopy approach for the design of nanometer digital circuits tolerant to process variations is proposed. Two optimization strategies are developed in this work, the first based on the homotopy continuation method (HCM) and the second based on a modification of HCM, called in this work reboot homotopy continuation method (RHCM). Three logic paths were implemented to validate the algorithms. The optimization results obtained with the proposed strategies are compared with a Lagrange-Multipliers-based framework. Results obtained from HCM method are equivalent to the obtained with Lagrange Multipliers. On the other side, results obtained from the RHCM method are more accurate than the obtained with HCM and Lagrange Multipliers. Furthermore, the area used to implement the logic paths is lower when RHCM is applied. Moreover, the number of Newton-Rhapson iterations required to find the solutions are lower when RHCM is used; consequently, time computing is also lower.
引用
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页数:12
相关论文
共 30 条
[1]  
[Anonymous], 2013, Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
[2]  
[Anonymous], 2008 14 IEEE INT S A
[3]  
[Anonymous], SOURCES OF VARIATION
[4]  
Ben Y, 2010, INT SYM QUAL ELECT, P114, DOI 10.1109/ISQED.2010.5450391
[5]   A heuristic method for statistical digital circuit sizing [J].
Boyd, Stephen ;
Kim, Seting-Jean ;
Patil, Dinesh ;
Horowitz, Mark .
DESIGN AND PROCESS INTEGRATION FOR MICROELECTRONIC MANUFACTURING IV, 2006, 6156
[6]  
Casagrande A. J., 2015, ROBUST LOW POWER DIS, P62
[7]  
Chang HL, 2003, ICCAD-2003: IEEE/ACM DIGEST OF TECHNICAL PAPERS, P621
[8]   Simultaneous gate sizing and placement [J].
Chen, W ;
Hsieh, CT ;
Pedram, M .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2000, 19 (02) :206-214
[9]   Novel sizing algorithm for yield improvement under process variation in nanometer technology [J].
Choi, SH ;
Paul, BC ;
Roy, K .
41ST DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2004, 2004, :454-459
[10]  
Chopra K., 2005, IEEE ACM INT C COMP, V2005, P1020, DOI [10.1109/ICCAD.2005.1560212, DOI 10.1109/ICCAD.2005.1560212]