Vibration frequency measurement with speckle interferometry

被引：1

作者：

Matsumoto, T ^{[1
]}

Kitagawa, Y ^{[1
]}

Kosaka, N ^{[1
]}

Kinoshita, Y ^{[1
]}

Shimada, M ^{[1
]}

Adachi, M ^{[1
]}

机构：

[1] Hyogo Prefectural Inst Technol, Kobe, Hyogo 6540037, Japan

来源：

OPTOMECHATRONIC SENSORS, ACTUATORS, AND CONTROL | 2004年 / 5602卷

关键词：

electronic speckle pattern interferometry; vibration analysis; frequency measurement; diode laser; laser modulation;

D O I：

10.1117/12.571238

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

We propose a new method for measuring vibration frequency with electronic speckle pattern interferometry. In this method, laser beam wavelength is modulated with an independent frequency. In accordance with a frequency difference between the modulation and the vibration, a maximum intensity in a fringe pattern image changes. When the modulation magnitude is reduced, the frequency difference between the vibration and the modulation, in which the fringe pattern diminishes, widens and the maximum intensity in the fringe pattern image alters gently while the modulation frequency is scanned. Then we can search the vibration frequency, in which the maximum intensity in the image has a peak when the modulation frequency equals to the vibration frequency, with a hill-climbing method. It is confirmed in an experiment that the vibration frequency can be measured in a short time sufficient for practical use.

引用

页码：91 / 98

页数：8

共 50 条

[21] Compensation techniques in speckle interferometry
Sirohi, RS
Gupta, B
LASER INTERFEROMETRY X: TECHNIQUES AND ANALYSIS AND APPLICATIONS, PTS A AND B, 2000, 4101 : 225 - 230
[22] Vibration phase measurements using holographic optical elements based electronic speckle pattern interferometry
Bavigadda, Viswanath
Jallapuram, Raghavendra
Toal, Vincent
Mihaylova, Emilia
SPECKLE 2010: OPTICAL METROLOGY, 2010, 7387
[23] Contrast and sensitivity of the vibration fringes in time-averaged electronic speckle-pattern interferometry: effect of variations of force level
Wong, WO
Chan, KT
Leung, TP
OPTICS AND LASER TECHNOLOGY, 1997, 29 (04): : 179 - 185
[24] Measurement of plant movement in young and mature plants using electronic speckle pattern interferometry
Dyrseth, AA
APPLIED OPTICS, 1996, 35 (19): : 3695 - 3701
[25] RESIDUAL STRESS MEASUREMENT ON THE BUTT-WELDED AREA BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
Kim, Kyeongsuk
Choi, Taeho
Na, Man Gyun
Jung, Hyunchul
NUCLEAR ENGINEERING AND TECHNOLOGY, 2015, 47 (01) : 115 - 125
[26] MEASUREMENT OF THERMAL-EXPANSION OF A PISTON USING HOLOGRAPHIC AND ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
RATNAM, MM
EVANS, WT
TYRER, JR
OPTICAL ENGINEERING, 1992, 31 (01) : 61 - 69
[27] Simultaneous measurement of temperature by Background-oriented Schlieren and speckle interferometry: Comparison and validation
Fang, Siyuan
Gao, Zhongfang
Guo, Bicheng
Sangeorzan, Brian
Yang, Lianxiang
OPTICS AND LASER TECHNOLOGY, 2025, 182
[28] Measurement of in-plane strain with shearography and electronic speckle pattern interferometry for composite materials
Martinez-Garcia, Amalia
Rayas-Alvarez, Juan-Antonio
Cordero, Raul
PROCEEDINGS OF 2014 INTERNATIONAL SYMPOSIUM ON OPTOMECHATRONIC TECHNOLOGIES (ISOT), 2014, : 187 - 191
[29] Vibration phase mapping using holographic optical element-based electronic speckle pattern interferometry
Bavigadda, Viswanath
Mihaylova, Emilia
Jallapuram, Raghavendra
Toal, Vincent
OPTICS AND LASERS IN ENGINEERING, 2012, 50 (08) : 1161 - 1167
[30] Versatile electronic speckle pattern interferometry
Sirohi, RS
LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS, 1998, 3478 : 417 - 420

← 1 2 3 4 5 →