Light extraction enhancement and directional control of scintillator by using microlens arrays

被引:19
作者
Chen, Xueye [1 ]
Liu, Bo [1 ]
Zhu, Jingtao [1 ]
Gu, Mu [1 ]
Chen, Hong [1 ]
Liu, Jinliang [2 ,3 ]
Chen, Liang [2 ,3 ]
Ouyang, Xiaoping [2 ,3 ]
机构
[1] Tongji Univ, Sch Phys Sci & Engn, Shanghai Key Lab Special Artificial Microstruct M, Shanghai 200092, Peoples R China
[2] Northwest Inst Nucl Technol, State Key Lab Intense Pulsed Radiat Simulat & Eff, Xian 710024, Shaanxi, Peoples R China
[3] Northwest Inst Nucl Technol, Radiat Detect Res Ctr, Xian 710024, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
RAPID FABRICATION; NANOSPHERES; DEVICES;
D O I
10.1364/OE.26.023132
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The total internal reflection restricts light extraction efficiency of scintillator, leading to reduced detection efficiency and signal-to-noise ratio in the field of scintillator-based radiation detection system. This research presents the method of applying microlens arrays to improve the light extraction efficiency as well as achieve directional control of emission for scintillators. For BGO (Bi4Ge3O12) scintillator covered with PMMA (polymethyl-methacrylate) hemispherical microlens array, the 2.59-fold in particular angle (theta(em) = 45 degrees) and overall 1.94-fold angle-integrated enhancement ratios have been obtained. Furthermore, we analyze and optimize some parameters of microlens arrays such as the packing arrangement, duty ratio, size, refractive index, and shape. As a result, when the refractive index of microlens is slightly larger than that of scintillator, a maximum 6.23-fold angle-integrated enhancements can be achieved. It can be concluded that the microlens array covered on scintillator has considerable value for practical applications on radiation detection. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:23132 / 23141
页数:10
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