Incorporating physical design-for-test into routing

被引：0

作者：

McGowen, R ^{[1
]}

Ferguson, FJ ^{[1
]}

机构：

[1] Intel Corp, Santa Clara, CA 95052 USA

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639681

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In addition to automatically generating correct wiring, routers are used to meet additional design goals. Examples include reducing capacitive coupling and improving yield. Using routers to improve testability has been mentioned in the literature, but concrete rules or methods have not been explained or implemented. In this paper, we show how a modified router improves bridge fault testability for two different test metrics, static-voltage testing and pseudoexhaustive segmentation testing, with no significant increase in area or time. This method is flexible in that further testability improvements are possible by trading off routing area or routing time.

引用

页码：685 / 693

页数：9