Photoemission from diamond films and substrates into water: dynamics of solvated electrons and implications for diamond photoelectrochemistry

被引:31
作者
Hamers, R. J. [1 ]
Bandy, J. A. [1 ]
Zhu, D. [1 ]
Zhang, L. [1 ]
机构
[1] Univ Wisconsin, Dept Chem, Madison, WI 53706 USA
基金
美国国家科学基金会;
关键词
ORIENTED PYROLYTIC-GRAPHITE; ELECTROCHEMICAL OXIDATION; NANOCRYSTALLINE DIAMOND; PHOTOCURRENT KINETICS; NANOELECTRODE ARRAYS; THIN-FILMS; EMISSION; AFFINITY; HYDROGEN; TEMPERATURE;
D O I
10.1039/c4fd00039k
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Illumination of diamond with above-bandgap light results in emission of electrons into water and formation of solvated electrons. Here we characterize the materials factors that affect that dynamics of the solvated electrons produced by illumination of niobium substrates and of diamond thin films grown on niobium substrates using transient absorption spectroscopy, and we relate the solvated electron dynamics to the ability to reduce N-2 to NH3. For diamond films grown on niobium substrates for different lengths of time, the initial yield of electrons is similar for the different samples, but the lifetime of the solvated electrons increases approximately 10-fold as the film grows. The time-averaged solvated electron concentration and the yield of NH3 produced from N-2 both show maxima for films grown for 1-2 hours, with thicknesses of 100-200 nm. Measurements at different values of pH on boron-doped diamond films show that the instantaneous electron emission is nearly independent of pH, but the solvated electron lifetime becomes longer as the pH is increased from pH = 2 to pH = 5. Finally, we also illustrate an important caveat arising from the fact that charge neutrality requires that light-induced emission of electrons from diamond must be accompanied by corresponding oxidation reactions. In situations where the valence band holes cannot readily induce solution-phase oxidation reactions, the diamond itself can be etched by reacting with water to produce CO. Implications for other reactions such as photocatalytic CO2 reduction are discussed, along with strategies for mitigating the potential photo-etching phenomena.
引用
收藏
页码:397 / 411
页数:15
相关论文
共 38 条
  • [1] BABENKO SD, 1977, J ELECTROANAL CHEM, V76, P347, DOI 10.1016/0368-1874(77)80102-0
  • [2] NITROGEN-FIXATION IN SOLUTION
    BAZHENOVA, TA
    SHILOV, AE
    [J]. COORDINATION CHEMISTRY REVIEWS, 1995, 144 : 69 - 145
  • [3] PHOTOCURRENT KINETICS AT THE ELECTRON-EMISSION FROM METAL INTO ELECTROLYTE SOLUTION .10. DISCHARGE OF SHORT-LIVED INTERMEDIATE SPECIES
    BENDERSKII, AV
    BENDERSKII, VA
    KRIVENKO, AG
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1995, 380 (1-2): : 7 - 27
  • [4] PHYSICAL ASPECTS OF ONE-PHOTON AND 2-PHOTON PHOTOEMISSION FROM METALS INTO ELECTROLYTE SOLUTIONS
    BENDERSKII, VA
    BABENKO, SD
    ZOLOTOVITSKII, YM
    KRIVENKO, AG
    RUDENKO, TS
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1974, 56 (03) : 325 - 344
  • [5] THE ELECTROCHEMISTRY OF BLACK CARBONS
    BESENHARD, JO
    FRITZ, HP
    [J]. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH, 1983, 22 (12): : 950 - 975
  • [7] Mechanism for electrochemical oxidation of highly oriented pyrolytic graphite in sulfuric acid solution
    Choo, Hyun-Suk
    Kinumoto, Taro
    Jeong, Soon-Ki
    Iriyama, Yasutoshi
    Abe, Takeshi
    Ogumi, Zempachi
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2007, 154 (10) : B1017 - B1023
  • [8] Electrochemical oxidation of highly oriented pyrolytic graphite during potential cycling in sulfuric acid solution
    Choo, Hyun-Suk
    Kinumoto, Taro
    Nose, Masafumi
    Miyazaki, Kohei
    Abe, Takeshi
    Ogumi, Zempachi
    [J]. JOURNAL OF POWER SOURCES, 2008, 185 (02) : 740 - 746
  • [9] Mechanism of N2 Reduction to NH3 by Aqueous Solvated Electrons
    Christianson, Jeffrey R.
    Zhu, Di
    Hamers, Robert J.
    Schmidt, J. R.
    [J]. JOURNAL OF PHYSICAL CHEMISTRY B, 2014, 118 (01) : 195 - 203
  • [10] Low-threshold electron emission from diamond
    Cui, JB
    Ristein, J
    Ley, L
    [J]. PHYSICAL REVIEW B, 1999, 60 (23) : 16135 - 16142