Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

被引：7

作者：

Boerasu, I

Pereira, M

Vasilevskiy, M

Gomes, MJM ^{[1
]}

Watts, B

Leccabue, F

Vilarinho, PM

机构：

[1] Univ Minho, Phys Ctr, P-4710057 Braga, Portugal

[2] CNR, Ist Maspec, I-43100 Parma, Italy

[3] Univ Aveiro, CICECO, Dept Ceram & Glass Engn, P-3810193 Aveiro, Portugal

来源：

APPLIED SURFACE SCIENCE | 2003年 / 208卷

关键词：

PZTN film; laser ablation; optical properties; effective dielectric function;

D O I：

10.1016/S0169-4332(02)01400-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

According to the general formula Pb1-x/2(Zr0.65Ti0.35)(1-x) Nb-x O-3 + 4 mol% PbO excess (X = 1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(1 0 0) substrates using either a Nd:YAG (355 nm) or a XeCl (308 nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：604 / 610

页数：7

共 10 条

[1] Optical properties of PZT 65/35 thin films deposited by sol-gel [J].