Fabrication of a CMOS compatible pressure sensor for harsh environments

被引:56
作者
Pakula, LS
Yang, H
Pham, HTM
French, PJ
Sarro, PM
机构
[1] Delft Univ Technol, DIMES EI, NL-2628 CD Delft, Netherlands
[2] Delft Univ Technol, DIMES ECTM, NL-2628 CD Delft, Netherlands
关键词
D O I
10.1088/0960-1317/14/11/007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The fabrication and characteristics of CMOS compatible absolute pressure sensors for harsh environments are presented in this paper. The sensor which was fabricated using post-processing surface micromachining consists of 100 circular membranes with a total capacity of 14 pF. PECVD SiC was used due to its good mechanical properties, but since SiC has high resistivity, aluminium layers were used for electrodes. The stiction problems were avoided by using polyimide PI2610 as a sacrificial layer. The pressure sensors were fabricated and the change of capacitance over full pressure range, 5 bar, was 3.4 pF.
引用
收藏
页码:1478 / 1483
页数:6
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