Analysis of the connection section between K connector and microstrip with electromagnetic bandgap (EBG) structure

被引：14
作者：
Xu, H.-J. [1 ]
Zhang, Y.-H. [1 ]
Fan, Y. [1 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China
来源：
PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 2007年 / 73卷
关键词：
D O I：
10.2528/PIER07040801
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
For the application of K connector (K103F) at K a-band, many problems exist, due to the complex method of installation. In this paper, the test fixture is simplified, and the performance of this section is improved with the Electromagnetic bandgap (EBG) structure. Simulation results are presented for the connection structure with EBG; plots of the input reflection of geometrical and physical parameters are reported and commented on.
引用
收藏
页码：239 / 247
页数：9
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