Defect-based testing for fabless companies

被引：1

作者：

Khare, J ^{[1
]}

Heineken, HT ^{[1
]}

机构：

[1] Level One Commun, Sacramento, CA 95827 USA

来源：

2000 IEEE INTERNATIONAL WORKSHOP ON DEFECT BASED TESTING, PROCEEDINGS | 2000年

关键词：

D O I：

10.1109/DBT.2000.843686

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

This paper describes the importance of defect-based testing and diagnostics for fabless semiconductor companies. The examples in the paper show that defect statistics obtained from defect-based testing can be used by fabless companies to optimize their designs for a target foundry, thereby significantly reducing die cost and improving profit margins. The paper also describes a defect parameter extraction system based on defect-based testing.

引用

页码：23 / 29

页数：7

共 17 条

[1]

[Anonymous], CONTAMINATION DEFECT

[2]

*FABL SEM ASS, 1999, ANN REP

[3] MODELING THE CRITICAL AREA IN YIELD FORECASTS [J].