Temperature and annealing effects on photoluminescence spectra of (InAs)1/(GaP)2 superlattices grown by solid-source molecular beam epitaxy

被引:2
作者
Cheng, YC [1 ]
Chi, S
Chou, ST
Huang, KF
机构
[1] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 300, Taiwan
[2] Compound Semicond Technol Inc, Huko 303, Taiwan
[3] Natl Chiao Tung Univ, Electro Phys Dept, Hsinchu 300, Taiwan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2000年 / 39卷 / 10A期
关键词
multi-axial strain; SSMBE; photoluminescence; RTA; InAs/GaP;
D O I
10.1143/JJAP.39.L968
中图分类号
O59 [应用物理学];
学科分类号
摘要
Anomalous variation of photoluminescence (PL) wavelengths with temperature was observed in (InAs)(1)/(GaP)(2) short-period-superlattice (SPS) quantum wells grown by solid-source molecular beam epitaxy with different phosphorus and arsenic cracker temperatures. We believed that the anomalous PL behavior could be attributed to the multi-axial strain effect existed at the abrupt InAs and GaP interfaces in the SPS structure. After rapid thermal anneal (RTA) treatment, the anomalous PL spectra in the low temperature region disappeared but the high temperature PL characteristics remained, which revealed the thermal stability of the (InAs)(1)/(GaP)(2) quantum well structures and its potential in replacing InGaAsP quaternary.
引用
收藏
页码:L968 / L971
页数:4
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