Structural and optical properties of thin films porous amorphous silicon carbide formed by Ag-assisted photochemical etching

被引:15
作者
Boukezzata, A. [1 ]
Keffous, A. [1 ]
Cheriet, A. [1 ]
Belkacem, Y. [1 ]
Gabouze, N. [1 ]
Manseri, A. [1 ]
Nezzal, G. [2 ]
Kechouane, M. [3 ]
Bright, A. [3 ]
Guerbous, L. [4 ]
Menari, H. [1 ]
机构
[1] Silicon Technol Dev Unit UDTS, Algiers, Algeria
[2] Houari Boumed Univ USTHB, Fac Chem, Algiers, Algeria
[3] Houari Boumed Univ USTHB, Fac Phys, Algiers, Algeria
[4] Algerian Nucl Res Ctr CRNA, Algiers, Algeria
关键词
Silicon carbide; Thin layer; Photochemical etching; SIMS; SEM;
D O I
10.1016/j.apsusc.2010.03.037
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this work, we present the formation of porous layers on hydrogenated amorphous SiC (a-SiC: H) by Ag-assisted photochemical etching using HF/K(2)S(2)O(8) solution under UV illumination at 254 nm wavelength. The amorphous films a-SiC: H were elaborated by d.c. magnetron sputtering using a hot pressed polycrystalline 6H-SiC target. Because of the high resistivity of the SiC layer, around 1.6 M Omega cm and in order to facilitate the chemical etching, a thin metallic film of high purity silver (Ag) has been deposited under vacuum onto the thin a-SiC: H layer. The etched surface was characterized by scanning electron microscopy, secondary ion mass spectroscopy, infrared spectroscopy and photoluminescence. The results show that the morphology of etched a-SiC: H surface evolves with etching time. For an etching time of 20 min the surface presents a hemispherical crater, indicating that the porous SiC layer is perforated. Photoluminescence characterization of etched a-SiC: H samples for 20 min shows a high and an intense blue PL, whereas it has been shown that the PL decreases for higher etching time. Finally, a dissolution mechanism of the silicon carbide in 1HF/1K(2)S(2)O(8) solution has been proposed. (C) 2010 Elsevier B. V. All rights reserved.
引用
收藏
页码:5592 / 5595
页数:4
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