Athermal critical stresses for dislocation propagation in nanocrystalline aluminium

被引:4
作者
Brandl, Christian [1 ]
Tiwari, Shreevant [1 ]
Derlet, Peter M. [1 ]
Van Swygenhoven, Helena [1 ]
机构
[1] Paul Scherrer Inst, NUM ASQ Mat Sci & Simulat, CH-5430 Villigen, Switzerland
关键词
nanocrystalline metals; molecular dynamics; CROSS-SLIP; BICRYSTAL INTERFACES; MOLECULAR-DYNAMICS; METALS; NUCLEATION; DEFORMATION; NI;
D O I
10.1080/14786430903124444
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Molecular dynamics simulations investigating the mechanical properties of nanocrystalline Al have revealed the importance of both dislocation nucleation at grain boundaries and subsequent propagation as possible rate-limiting microscopic plastic process. Here, we present an approach to determine the athermal stress-strain behaviour of selected dislocations as they propagate within the nanocrystalline environment. In the first case study, the critical resolved shear stress to depin resulting into a planar propagation is found to be 735 MPa. In a second case study, a pinned dislocation is found to cross-slip at a critical resolved shear stress of 372 MPa to circumvent a near unfavoured grain boundary region.
引用
收藏
页码:977 / 989
页数:13
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