Metrology of DNA Arrays by Super-Resolution Microscopy

被引：0

作者：

Green, Christopher ^{[1
]}

Schutt, Kelly ^{[1
]}

Morris, Noah ^{[2
]}

Hughes, William L. ^{[1
]}

Kuang, Wan ^{[2
]}

Graugnard, Elton ^{[1
]}

机构：

[1] Boise State Univ, Micron Sch Mat Sci & Engn, Boise, ID 83725 USA

[2] Boise State Univ, Dept Elect & Comp Engn, Boise, ID 83725 USA

来源：

2017 IEEE WORKSHOP ON MICROELECTRONICS AND ELECTRON DEVICES (WMED) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：27 / 28

页数：2

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