Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

被引：14
|
作者：
Kong, FP [1 ]
Kostecki, R
McLarnon, F
Muller, RH
机构：
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Environm Energy Technol Div, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
来源：
THIN SOLID FILMS | 1998年 / 313卷
关键词：
spectroscopic ellipsometry; nickel hydroxide; electrochemical precipitation; inhomogeneous films; effective medium approximation;
D O I：
10.1016/S0040-6090(97)00994-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm(3). The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle. Published by Elsevier Science S.A.
引用
收藏
页码：775 / 780
页数：6
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