Variation of the relative permittivity of charged dielectrics

被引:8
作者
Ong, CK [1 ]
Song, ZG
Oh, KH
Gong, H
Le Gressus, C
机构
[1] Natl Univ Singapore, Dept Phys, Singapore 119260, Singapore
[2] Natl Univ Singapore, Dept Mat Sci, Singapore 119260, Singapore
[3] Ctr Etud Bruyeres Le Chatel, CEA, DAM, F-91680 Bruyeres Le Chatel, France
关键词
D O I
10.1063/1.120723
中图分类号
O59 [应用物理学];
学科分类号
摘要
The variation of the relative permittivity of charged dielectrics with trapped charge density has been investigated by a time-resolved current method, in conjunction with a mirror image method employing a scanning electron microscope. The calculation is made by a mathematical expression derived from classical electromagnetic theory. It is found that the relative permittivity of the charged area in the polymethylmethacrylate sample increases with the trapped charge density and saturates at a certain value of the trapped charge density. These observations have been discussed by analogy with the dielectric saturation occurring at a high applied external electric field. (C) 1998 American Institute of Physics.
引用
收藏
页码:317 / 319
页数:3
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