Structural and magnetic characterization of (Zn,Fe)Te thin films grown by MBE

被引:5
作者
Ishitsuka, Satoshi [1 ]
Domon, Takeru [1 ]
Akiyama, Ryota [1 ]
Kanazawa, Ken [1 ]
Kuroda, Shinji [1 ]
Ofuchi, Hironori [2 ]
机构
[1] Univ Tsukuba, Inst Mat Sci, 1-1-1 Tennoudai, Tsukuba, Ibaraki 3058573, Japan
[2] JASRI SPring 8, Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan
来源
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 7-8 | 2014年 / 11卷 / 7-8期
关键词
diluted magnetic semiconductors; II-VI compounds; molecular beam epitaxy; ferromagnetism; SEMICONDUCTORS;
D O I
10.1002/pssc.201300649
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the structural and magnetic properties of Zn1xFex Te with an aim of discerning the intrinsic magnetism of this ternary compounds. Thin films of Zn1xFex Te with a high Fe composition up to x = 0.2 were grown by molecular beam epitaxy (MBE) in the excess of Te flux against Zn flux. The structural analyses using X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) measurements reveal that crystals of the pure diluted phase are grown at low Fe compositions less than x = 0.02, while precipitates of extrinsic phases start to be formed at higher Fe compositions. In the magnetization measurements, the films of x <= 0.02, which were confirmed to be of the pure diluted phase, exhibit paramagnetic behaviors down to 2 K. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
引用
收藏
页码:1312 / 1315
页数:4
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