Single-electron tunneling devices as a possible dc current standard

被引:0
|
作者
Furlan, M [1 ]
Eichenberger, AL
Kach, E
Jeanneret, B
Jeckelmann, B
机构
[1] Swiss Fed Off Metrol, CH-3084 Wabern, Switzerland
[2] ETHZ Honggerberg, Solid State Phys Lab, CH-8093 Zurich, Switzerland
来源
HELVETICA PHYSICA ACTA | 1998年 / 71卷
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Control of the tunneling rate of single electrons is possible in systems of small tunnel junctions showing a Coulomb blockade. An external gate potential may be appropriately set to allow the transfer of an exactly given number of charges. With an rf drive at the gate, the de current is consequently determined by the rf frequency. We are currently investigating the feasibility of a new current standard, based on nanometer sized single-electron tunneling devices. A very brief status report is given, and first experimental results on the Coulomb blockade are presented.
引用
收藏
页码:5 / 6
页数:2
相关论文
共 50 条
  • [1] Single-electron tunneling devices
    Hadley, P
    LECTURES ON SUPERCONDUCTIVITY IN NETWORKS AND MESOSCOPIC SYSTEMS, 1998, (427): : 256 - 270
  • [2] Standards of current and capacitance based on single-electron tunneling devices
    Keller, MW
    RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS, 2001, 146 : 291 - 316
  • [3] Electron counting of single-electron tunneling current
    Fujisawa, T
    Hayashi, T
    Hirayama, Y
    Cheong, HD
    Jeong, YH
    APPLIED PHYSICS LETTERS, 2004, 84 (13) : 2343 - 2345
  • [5] FABRICATION OF MULTILAYER SINGLE-ELECTRON TUNNELING DEVICES
    VISSCHER, EH
    VERBRUGH, SM
    LINDEMAN, J
    HADLEY, P
    MOOIJ, JE
    APPLIED PHYSICS LETTERS, 1995, 66 (03) : 305 - 307
  • [6] SINGLE-ELECTRON TURNSTILE AS A CURRENT STANDARD
    VERBRUGH, SM
    TANS, SJ
    DELACOURT, P
    HARMANS, CJPM
    MOOIJ, JE
    PHYSICA B, 1994, 194 : 1041 - 1042
  • [7] Magnetoasymmetric current fluctuations of single-electron tunneling
    Sanchez, David
    PHYSICAL REVIEW B, 2009, 79 (04):
  • [8] On the origin of energy loss in single-electron tunneling devices
    Hoekstra, J
    PROCEEDINGS OF THE 2001 WORKSHOP ON NONLINEAR DYNAMICS OF ELECTRONIC SYSTEMS, 2001, : 117 - 120
  • [9] Shot noise in ferromagnetic single-electron tunneling devices
    Bulka, BR
    Martinek, J
    Michalek, G
    Barnas, J
    PHYSICAL REVIEW B, 1999, 60 (17) : 12246 - 12255
  • [10] Measurement of the frequency dependence of a single-electron tunneling capacitance standard
    Eichenberger, AL
    Keller, MW
    Martinis, JM
    Zimmerman, NM
    2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2000, : 16 - 17