A 0.13 μm CMOS System-on-Chip for a 512 x 424 Time-of-Flight Image Sensor With Multi-Frequency Photo-Demodulation up to 130 MHz and 2 GS/s ADC

被引:147
作者
Bamji, Cyrus S. [1 ]
O'Connor, Patrick [1 ]
Elkhatib, Tamer [1 ]
Mehta, Swati [1 ]
Thompson, Barry [1 ]
Prather, Lawrence A. [1 ]
Snow, Dane [1 ]
Akkaya, Onur Can [1 ]
Daniel, Andy [1 ]
Payne, Andrew D. [1 ]
Perry, Travis [1 ]
Fenton, Mike [1 ]
Chan, Vei-Han [1 ]
机构
[1] Microsoft, Mountain View, CA 94043 USA
关键词
Natural user interface (NUI); time-of-flight (TOF); quantum efficiency modulation (QEM); range imaging; 3D imaging;
D O I
10.1109/JSSC.2014.2364270
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We introduce a 512 x 424 time-of-flight (TOF) depth image sensor designed in a TSMC 0.13 mu m LP 1P5M CMOS process, suitable for use in Microsoft Kinect for XBOX ONE. The 10 mu m x 10 mu m pixel incorporates a TOF detector that operates using the quantum efficiency modulation (QEM) technique at high modulation frequencies of up to 130 MHz, achieves a modulation contrast of 67% at 50 MHz and a responsivity of 0.14 A/W at 860 nm. The TOF sensor includes a 2 GS/s 10 bit signal path, which is used for the high ADC bandwidth requirements of the system that requires many ADC conversions per frame. The chip also comprises a clock generation circuit featuring a programmable phase and frequency clock generator with 312.5-ps phase step resolution derived from a 1.6 GHz oscillator. An integrated shutter engine and a programmable digital micro-sequencer allows an extremely flexible multi-gain/multi-shutter and multi-frequency/multi-phase operation. All chip data is transferred using two 4-lane MIPI D-PHY interfaces with a total of 8 Gb/s input/output bandwidth. The reported experimental results demonstrate a wide depth range of operation (0.8-4.2 m), small accuracy error (<1%), very low depth uncertainty (<0.5% of actual distance), and very high dynamic range (64 dB).
引用
收藏
页码:303 / 319
页数:17
相关论文
共 24 条
  • [1] [Anonymous], ISSCC FEB
  • [2] Bamji C., 2005, U.S. Patent, Patent No. 6919549
  • [3] Demodulation pixel based on static drift fields
    Buettgen, Bernhard
    Lustenberger, Felix
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (11) : 2741 - 2747
  • [4] CHARBON E, 2003, Patent No. 6515740
  • [5] Avalanche photodiodes and quenching circuits for single-photon detection
    Cova, S
    Ghioni, M
    Lacaita, A
    Samori, C
    Zappa, F
    [J]. APPLIED OPTICS, 1996, 35 (12): : 1956 - 1976
  • [6] Achieving sub-millimetre precision with a solid-state full-field heterodyning range imaging camera
    Dorrington, A. A.
    Cree, M. J.
    Payne, A. D.
    Conroy, R. M.
    Carnegie, D. A.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (09) : 2809 - 2816
  • [7] Time-of-flight 3-D imaging pixel structures in standard CMOS processes
    Durini, Daniel
    Brockherde, Werner
    Ulfig, Wiebke
    Hosticka, Bedrich J.
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (07) : 1594 - 1602
  • [8] A 4 X 64 pixel CMOS image sensor for 3-D measurement applications
    Elkhalili, O
    Schrey, OM
    Mengel, P
    Petermann, M
    Brockherde, W
    Hosticka, BJ
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2004, 39 (07) : 1208 - 1212
  • [9] IMPLEMENTATION OF TRUE SINGLE-PHASE CLOCK D-FLIPFLOPS
    HUANG, CG
    [J]. ELECTRONICS LETTERS, 1994, 30 (17) : 1373 - 1374
  • [10] Jalil J, 2013, IEEE MICROW MAG, V14, P97, DOI 10.1109/MMM.2013.2259401