Growth of rubrene thin film, spherulites and nanowires on SiO2

被引：25
作者：
Luo, Y.
Brun, M.
Rannou, P.
Grevin, B.
机构：
[1] Univ Grenoble 1, CNRS, CEA, LEMOH,DRFMC, F-38054 Grenoble, France
[2] MINATEC, CEA, LETI, F-38054 Grenoble 9, France
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2007年 / 204卷 / 06期
关键词：
D O I：
10.1002/pssa.200675340
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The growth of rubrene thin films thermally evaporated under ultra-high vacuum (UHV) on SiO2 has been investigated by combining atomic force microscopy (AFM), scanning electron microscopy (SEM), and polarized optical microscopy (POM) techniques. A mode of thin film growth in which an amorphous continuous holy film first covers the substrate, and acts afterwards as a template for the nucleation of polycrystalline rubrene spherulites, has been identified. Additionally, rubrene one-dimensional structures have been observed with a catalyst-free growth process. (c) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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收藏
页码：1851 / 1855
页数：5
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