A 3D stacked memory integrated on a logic device using SMAFTI technology

被引:42
作者
Kurita, Yoichiro [1 ]
Matsui, Satoshi [1 ]
Takahashi, Nobuaki [1 ]
Soejima, Koji [1 ]
Komuro, Masahiro [1 ]
Itou, Makoto [1 ]
Kakegawa, Chika [1 ]
Kawano, Masaya [1 ]
Egawa, Yoshimi [2 ]
Saeki, Yoshihiro [2 ]
Kikuchi, Hidekazu [2 ]
Kato, Osamu [2 ]
Yanagisawa, Azusa [2 ]
Mitsuhashi, Toshiro [2 ]
Ishino, Masakazu [3 ]
Shibata, Kayoko [3 ]
Uchiyama, Shiro [3 ]
Yamada, Junji [3 ]
Ikeda, Hiroaki [3 ]
机构
[1] NEC Elect, 1120 Shimokuzawa, Kanagawa 2291198, Japan
[2] Oki Elect Ind, Tokyo, Japan
[3] Elpida Memory, Tokyo, Japan
来源
57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS | 2007年
关键词
D O I
10.1109/ECTC.2007.373893
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A general-purpose 3D-LSI platform technology for a high-capacity stacked memory integrated on a logic device was developed for high-performance, power-efficient, and scalable computing. SMAFTI technology [1-5], featuring an ultra-thin organic interposer with high-density feedthrough conductive vias, was introduced for interconnecting the 3D stacked memory and the logic device. A DRAM-compatible manufacturing process was realized through the use of a "via-first" process and highly doped poly-Si through-silicon-vias (TSVs) for vertical traces inside memory dice. A multilayer ultra-thin die stacking process using micro-bump interconnection technology was developed, and Sn-Ag/Cu pillar bumps and Au/Ni backside bumps for memory dice were used for this technology. The vertical integration of stacked DRAM with TSVs and a logic device in a BGA package has been successfully achieved, and actual device operation has been demonstrated for the first time as a 3D-LSI with the DRAM introducing TSVs on the logic device.
引用
收藏
页码:821 / +
页数:3
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