Newborn Screening for Severe Combined Immunodeficiency

被引:25
作者
Routes, John [1 ,2 ]
Verbsky, James [1 ,3 ]
机构
[1] Med Coll Wisconsin, Dept Pediat, 9000 W Wisconsin Ave, Milwaukee, WI 53226 USA
[2] Med Coll Wisconsin, Div Asthma Allergy & Clin Immunol, 9000 W Wisconsin Ave, Milwaukee, WI 53226 USA
[3] Med Coll Wisconsin, Div Rheumatol, Milwaukee, WI 53226 USA
关键词
Severe combined immunodeficiency; T cell lymphopenia; T cell receptor excision circle; Newborn screening; Hematopoietic stem cell transplantation; TREC assay; 22Q11.2 DELETION SYNDROME; T-CELL LYMPHOPENIA; IMMUNE-DEFICIENCY; TRANSPLANTATION; STATE;
D O I
10.1007/s11882-018-0783-9
中图分类号
R392 [医学免疫学];
学科分类号
100102 ;
摘要
Purpose of Review This review provides a brief history of newborn screening (NBS) for severe combined immunodeficiency (SCID), discusses the theoretical basis for the T cell receptor excision circle (TREC) assay, highlights the results of recent studies using the TREC, and provides practical advice for the evaluation of infants with an abnormal TREC assay. Recent Findings Currently, all but three states perform NBS for SCID in the USA. NBS using the TREC assay is highly sensitive in identifying infants with SCID and may also identify infants with T cell lymphopenia due to other causes such as congenital syndromes, multiple congenital anamolies, and some combined immunodeficiencies. Summary Regardless of the genetic etiology, all forms of SCID are characterized by a severe deficiency of naive T cells. TRECs are a biomarker of newly formed, naive T cells that have recently left the thymus. Consequently, the TREC assay identifies infants with SCID and other causes of severe T cell lymphopenia.
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页数:7
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