Test and Reliability in Approximate Computing

被引：18

作者：

Anghel, Lorena ^{[1
]}

Benabdenbi, Mounir ^{[1
]}

Bosio, Alberto ^{[2
]}

Traiola, Marcello ^{[2
]}

Vatajelu, Elena Ioana ^{[1
]}

机构：

[1] Univ Grenoble Alpes, CNRS, TIMA Lab, F-38000 Grenoble, France

[2] UM, LIRMM CNRS, Montpellier, France

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2018年 / 34卷 / 04期

基金：

欧盟地平线“2020”;

关键词：

Approximate computing; Reliability; Test; ACCURACY; YIELD;

D O I：

10.1007/s10836-018-5734-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.

引用

页码：375 / 387

页数：13

共 43 条

[1]

Anghel L, 2017, P INT MIX SIGN TEST, P1

[2]

[Anonymous], 2009, Using code perforation to improve performance, reduce energy consumption, and respond to failures

[3]

[Anonymous], P WORKSH APPR COMP W

[4]

[Anonymous], 2013, Analog IC Reliability in Nanometer CMOS

[5]

Austin D.B. T., 2005, Proc. Asia South Pacific Design Automation, P2

[6]

Borkar S., 2004, P IEEE ACM DES AUT C, P7

[7]

Chakradhar ST, 2010, DES AUT CON, P865

[8] Convergence of recognition, mining, and synthesis workloads and its implications [J].

Chen, Yen-Kuang ;

Chhugani, Jatin ;

Dubey, Pradeep ;

Hughes, Christopher J. ;

Kim, Daehyun ;

Kumar, Sanjeev ;

Lee, Victor W. ;

Nguyen, Anthony D. ;

Smelyanskiy, Mikhail .

PROCEEDINGS OF THE IEEE, 2008, 96 (05) :790-807

[9]

Chippa V. K., 2013, P IEEE ACM DES AUT C

[10]

Chippa VK, 2015, IEEE T VERY LARGE SC, V22, P2004

← 1 2 3 4 5 →