Multiscale detection of defect in thin film transistor liquid crystal display panel

A new automated inspection algorithm is proposed for detecting blob-Mura defects based on multiscale in a thin film transistor liquid crystal display (TFT- LCD) panel. As such, new kernels with different sizes are defined and then used to detect blob-Mura defects with varying sizes and brightness levels. To extract a seed point, an adaptive multilevel-threshold method is employed. Initially, smaller kernels are used to detect smaller defects, then gradually larger kernels are applied to detect larger defects. Through simulation it was verified that the proposed algorithm has a superior capability for detecting blob-Mura defects.